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Agilent Technologies Inc. - G1315C (1200 Series) Diode-array Detector SL

Year of introduction 2006
Status available
Company Agilent Technologies Inc.
Categories Chromatography: LC-Detector: Diode Array
Ultra-fast LC

Ultra fast separations can generate sharp and narrow peaks with peak widths smaller than 1 second. The Agilent 1200 Series DAD SL offers multiple wavelength and full spectral detection at up to 80 Hz sampling rate, keeping up with the analysis speed of ultra-fast LC. Even when operated at high data rates, the 1200 Series DAD SL allows precise identification, quantification and peak purity analysis at trace levels. This exceptional capability assures that your ultra-fast LC methods comply with the strictest regulatory performance requirements.


Features
  • Up to 100 % resolution gain in ultra-fast LC with peak widths narrower than 1 second - by 80 Hz data acquisition rate of up to 8 signals.
  • Ultra-fast, high sensitive peak purity analysis and spectral conformation even at trace levels - by 80 Hz full spectral data acquisition.
  • Minimized short-term noise (typical < ± 6µAU ASTM) - by diode-array front-end electronics.
  • Increased practical sensitivity - by minimized noise, RI-sensitivity and dispersion of proprietary flow cell design of the standard, semi-micro and micro flow cell with 13-µL, 5-µL and 2-µL volume.
  • Maximum baseline stability and practical sensitivity under fluctuating ambient temperature and humidity conditions - by NEW electronic temperature control (ETC).
  • "Data never lost insurance" - by built-in data recovery card (DRC). A unique data recovery functionality prevents data losses in case of communication breakdowns between instrument and PC.
  • Level of data traceability – Patented RFID tracking technology for flow cells and UV lamp provides a new level of data traceability by saving all relevant meta data, such as product number, serial number and cell dimensions with each individual raw data file
  • Maximum flexibility for optimization of resolution, linearity and sensitivity - by programmable slit width and the selection of nine different flow cells
  • Future-proof electronics design – Built-in web-server, USB, PCMCIA (future WLAN, Bluetooth, Firewire).
  • Proven robustness and performance – built upon the optical design of the best-selling DAD in the world
Specifications
Specifications Agilent 1200 Diode-Array Detector SL
Detector type 1024-element diode array
Light sourceDeuterium and tungsten lamp
Short-term noise< ± 0.8 x 10 -5 AU at 254 nm and at 750 nm
Drift< 0.9 x 10 -3 AU/hr, at 254 nm
Linearity>2 AU upper limit
Wavelength range190-950 nm
Wavelength accuracy± 1 nm, self-calibration with deuterium lines, verification with holmium oxide filter
Slit widthProgrammable: 1, 2, 4, 8, 16 nm
Diode width< 1 nm
Wavelength bunchingProgrammable, 2 - 400 nm, in steps of 1 nm
Flow cells
Standard13-µL volume, 10 mm cell path length, 120 bar (1760 psi) pressure maximum
Semi-micro5-µL volume, 6 mm cell path length, 120 bar (1760 psi) pressure maximum
Micro2-µL volume, 3 mm cell path length, 400 bar (5880 psi) pressure maximum
Semi-nano500-nanoliter volume 10-mm cell path length, 50 bar (735 psi) pressure maximum
Nano80 nanoliter volume., 6-mm cell path length, 50 bar (735 psi) pressure maximum
Preparative3-mm cell path length, 120 bar (1760 psi) pressur maximum
0.3-mm cell path lenght, 20 bar (294 psi) pressure maximum, quartz
0.06-mm cell path length, 20 bar (294 psi) pressure maximum, quartz
High pressure1.7-µL volume, 6-mm cell path length, 400 bar (5880 psi) pressure maximum
Time programmableWavelength, polarity, peak width, lamp bandwidth, autobalance,
WL range, threshold, spectra storage mode
Spectral toolsData analysis software for spectra evaluation, including spectral libraries and peak purity functions
Analog outputRecorder/integrator 100 mV or 1 V, 2 outputs
GLP
Data recovery card to prevent data losses. RFID for electronics records of flow cell and UV lamp conditions (path length, volume, product number, serial number, test passed, usage). Electronic records of maintenance and errors. Early maintenance feedback (EMF) for continuous tracking of instrument usage, display of feedback messages if preset limits are exceeded. Verification of wavelength accuracy with built-in holmium oxide filter.





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01.03.2025
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