Agilent Technologies Inc. - G1365C (1200 Series) Multiple Wavelength Detector SL

Specifications Agilent 1200 Series Multiple Wavelength Detector SL
Detector type	1024-element diode array
Light source	Deuterium and tungsten lamp
Short-term noise	< ± 0.8 x 10 -5 AU at 254 nm and at 750 nm
Drift	< 0.9 x 10 -3 AU/hr, at 254 nm
Linearity	>2 AU upper limit
Wavelength range	190-950 nm
Wavelength accuracy	± 1 nm, self-calibration with deuterium lines, verification with holmium oxide filter
Slit width	Programmable: 1, 2, 4, 8, 16 nm
Diode width	< 1 nm
Wavelength bunching	Programmable, 2 - 400 nm, in steps of 1 nm
Flow cells
Standard	13-µL volume, 10 mm-cell path length, 120 bar (1760 psi) pressure maximum
Semi-micro	5-µL volume, 6-mm cell path length, 120 bar (1760 psi) pressure maximum
Micro	2-µL, volume, 3-mm cell path length, 400 bar (5880 psi) pressure maximum
Semi-nano	500-nanoliter volume., 10-mm cell path length, 50 bar (735 psi) pressure maximum
Nano	80-nanoliter volume, 6-mm cell path length, 50 bar (735 psi) pressure maximum
High pressure	1.7-µL volume, 6-mm cell path length, 400 bar (5880 psi) pressure maximum
Preparative	3-mm cell path length, 120 bar (1760 psi) pressur maximum 0.3-mm cell path lenght, 20 bar (294 psi) pressure maximum, quartz 0.06-mm cell path length, 20 bar (294 psi) pressure maximum, quartz
Time programmable	Wavelength, polarity, peak width, lamp bandwidth, autobalance, wavelength range, threshold, spectra storage mode
Analog output	Recorder/integrator 100 mV or 1 V, 2 outputs
GLP	RFID for electronics records of flow cell and UV lamp conditions (path length, volume, product number, serial number, test passed, usage). Electronic records of maintenance and errors. Early maintenance feedback (EMF) for continuous tracking of instrument usage, display of feedback messages if preset limits are exceeded. Verification of wavelength accuracy with built-in holmium oxide filter.