Instrument Database:
Seiko Instruments Inc. - SFT9455 Series Fluorescent X-ray Coating Thickness Gauge
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Year of introduction |
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Status |
historical ( out of sale ) |
Company |
Seiko Instruments Inc.
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Categories |
X-ray spectrometer: XRF |
OverviewSFT9455, the top model of the SFT9000 series, is a high performance thickness gauge that features a 75W high powered X-ray tube and a dual detector (semiconductor detector and proportional counter) and responds to all plate thickness measurement needs, including thin film, alloy film and submicroscopic measurements. In addition, SFT9455 can be used for qualitative analysis of extraneous substances and elemental analysis, as well as coating thickness measurement. Features
- Equipped with dual detection device (semiconductor detector/proportional counter) that features high resolution of X-ray energy (liquid nitrogen not needed) and excellent counting rate, which can be employed according to application.
- In particular, semiconductor detector has the below features as it can differentiate elements that are near each other, such as Ni and Cu: Can measure Ni/Cu and Au/Ni/Cu without a secondary filter; In the case of printed circuit boards with Br, can perform high-precision Au-coating thickness measurements without interference from Br; Can measure extremely thin Au plate that is less than 0.01µm
- Thin Film FP Software can be used for a wide range of applications including alloy plating with lead-free solder and composite plating.
- Round 15µm collimator standard installed, effective for measuring coating thickness in microscopic areas.
- Equipped with 75W high-powered x-ray tube.
- Can easily observe microscopic areas, equipped with four-step zoom.
- Large stage enables measurement of large printed circuit boards.
- Incident lighting makes samples easier to view.
- Collision prevention sensor makes contoured samples safe to use.
- High-accuracy stage drive train powered by servomotor.
- Measurement sample can be focused accurately by laser with one touch of the button.
- Report can be easily generated from measurement data with macro software.
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