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Instrument Database:
Foss A/S - Solid Product Analyzer
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| Year of introduction |
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| Status |
available |
| Company |
Foss A/S
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| Categories |
Spectrometer ( Molec. ): NIR
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The Solid Product Analyzer will analyse virtually any solid product. Non-destructive reflectance measurements are performed directly on the samples without any sample preparation.
The Solid Product Analyzer is a versatile tool for quality control and assurance laboratories where a variety of solid sample matrices need to be analysed. With the Solid Product Analyzer, powders, granules, pellets, flakes and fibers can be analysed without changing the instrument configuration; simply switch to a new sample cell.
Fine powders are analysed using a standard sample cup. Non-homogeneous materials such as pellets, flakes, or fibers, require a larger sampling area to maintain analytical performance. Therefore, cells with a sampling area up to 60 cm2 are included with the Solid Product Analyzer to average out any sample inhomogeneity.
The Solid Product Analyzer is available in two configurations. The standard analyser permits data collection from 1100-2500 nm, while the enhanced analyser includes the color region allowing spectral collection from 400-2500 nm.
With a FOSS patented modular design for laboratory instruments, other sampling modules can be interfaced to the Solid Product Analyzer. All FOSS Analyzers are fully validated and supplied with Vision spectral analysis software for windows.
Benefits and Features
- Analyse fine powders to coarse granular materials, pellets, flakes, fibers and films
- Versatile sample cells and accessories
- Measure in reflectance mode
- Flexible QC analyser
- Non-destructive testing
- No solvents or disposables
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| Specifications |
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Wavelength Range
Standard configuration (5000) 1100 - 2500nm
Enhanced configuration (6500) 400 - 2500nm
Photometric Range
3.0A, 400 - 2500nm
Operating Range
4.0A, 1100 - 2500nm
6.0A, 400 - 1100nm
RMS Noise at 0.0 Absorbance
400 - 700 nm less than 100uA
700 - 2500 nm less than 20uA
Data Interval
2.0nm
Scan Speed
1.8 Scans/second
Detectors
Silicon, 400 - 1100nm
Lead Sulfide, 1100 - 2500nm
Wavelength Accuracy (SD)
Based on instrument-to-instrument repeatability: 0.15nm
Based on currently accepted wavelength standards: 0.30nm
Instrument Wavelength Precision (SD)
0.01nm
Wavelength Linearity
1% of reading
Spectral Bandwidth
10nm ± 1nm in reflectance 8.5nm ± 1nm in transmission
Operating Temperature
60-90°F (15 - 32°C) nominal
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