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Instrument Database:
HORIBA Jobin Yvon - GD-Profiler 2™
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| Year of introduction |
2005 |
| Status |
available |
| Company |
HORIBA Jobin Yvon
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| Categories |
Spectrometer ( Atom. ): AES: GD-AES
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The GD-Profiler™ Series of RF Glow Discharge OES Instruments offers two models, each with a variety of options, to suit an extensive range of applications and budgets. The GD-Profiler 2™ offers high performance for a wide range of sample types, while the GD-Profiler HR™ offers unmatched performance not seen in any other instrument available today.
- RF-Only generator is Class E standard and optimized for stability and crater shape allowing for real surface analysis.
- Source can be pulsed with synchronized acquisition for optimum results on fragile samples. The use of an RF source allows analysis of conventional and non conventional layers and materials.
- Simultaneous optic provides full spectral coverage from 110 to 800nm, including deep UV access to analyze H, O, C, N and Cl.
- HORIBA Jobin Yvon original, ion-etched holographic gratings assure the highest light throughput for maximum light efficiency and sensitivity.
- Patented HDD® detection provides speed and sensitivity in detection without compromise.
- Easily accessible sample compartment allows plenty of room for sample loading.
- Powerful QUANTUM™ XP™ software with Tabler report writing tool.
- CenterLite laser pointer (patent pending) for precise sample loading.
- Monochromator option available only from HORIBA Jobin Yvon provides the perfect tool to increase instrument flexibility while adding "n+1" capability.
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