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Instrument Database:
Hitachi - Science & Technology - S-4300SE Analytical FESEM
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General
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This versatile microscope with a thermal FE source has been designed for applications in the semiconductor industry, materials and biological sciences where excellent beam stability, and high resolution are essential. There is a choice of specimen stages and optional accessories include electron beam lithography, cathodoluminescence, EBSP and EDX.
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