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Instrument Database:
Kratos Analytical - Axis 165
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| Year of introduction |
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| Status |
available |
| Company |
Kratos Analytical
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| Categories |
Surface Analysis: ESCA/XPS
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This is the "Multitechnique Benchmark" of the AXIS standard product range. It is designed to meet the most demanding needs of the Surface Scientist or Materials Analyst, offering considerable flexibility in configuration and capability. The instrument is offered in XPS, XPS/SAM or XPS/SIMS configurations. It is based on a 165mm mean radius hemispherical analyzer, with an eight channeltron detection system for excellent energy resolution and sensitivity at small analysis areas. A standard and key feature of the instrument in the magnetic immersion lens, which provides superior sensitivity at the small analysis areas, and enables the high performance XPS imaging to be obtained in realistic time frames. This is combined with the charge neutralization system, another standard feature, for outstanding performance on insulating materials. When combined with the automated sample stage, considerable flexibility is obtained for unattended operation. The XPS capability is available with both the standard Mg/Al source, or the high performance Al monochromatic source.
In addition to XPS, the AXIS 165 can accommodate a 15 kV, 1000Ĺ Scanning Auger capability. This is an electrostatic gun, using a lanthanum hexaboride filament for a high current capability. This combination provides SEM, BSE and Auger capabilities. The electron gun is under full computer control, enabling previously defined operational parameters to be stored and recalled for reproducible setup. A quadrupole mass analyzer can also be incorporated into the instrument, to provide either static or dynamic SIMS capabilities. The complete instrument is under control of the SUN computer workstation based VISION data system. This features a graphical user interface for ease of use and flexibility in data acquisition setup or processing.
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| Specifications |
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