New XRF with local analysis and mapping capabilities as standard features.
Reliable Analysis of a local area only 250µm diameter in wavelength dispersive mode - a world first! The original high sensitivity aperture and accurate sample positioning capability of the XRF-1700 is now improved in the XRF-1800, enabling any user selected part of the sample to be analyzed reliably and also provide high performance element mapping. An optional CCD camera may be used to observe the sample
High sensitivity, high resolution, and high precision ensured by new optics The X-ray beam path length is minimized increasing sensitivities for all the elements. High sensitivity and resolution are ensured over the entire wavelength range. Three selectable slits are provided: Standard Slit - High Sensitivity Slit - High Resolution Slit
Five apertures, with openings of 0.5, 3, 10, 20, and 30mm diameters are selectable to ensure high sensitivity in analysis, even of samples with a very small diameter
4kW X-ray tube with a thin window offers high reliability and long life The sensitivity is more than 30% higher compared with a conventional 3kW X-ray tube.
Rapid qualitative analysis ensured by ultrafast scanning speed - 300 °/min The elements ranging from Be to U are qualitatively determined in only two and a half minutes. Semi-quantiative determination is made possible using the fundamental parameter (FP) method, which requires no standard samples in the same time.
Determination of C,H,and O in organic samples Shimadzu's original integrated intensity measurement method and background fundamental parameter method enable carbon, hydrogen, and oxygen in organic samples to be reliably and quanitatively determined.
High performance analysis through simple operation A workstation based data system that operates in multitasking and multiwindowing environments ensures outstanding ease and simplicity of operation.
Control Method Fully automated by computer Automatic Ageing Programmable for automatic start & shut off
Maximum Rating 60kV, 140mA, (150mA option)
Output Stability ±0.005% for +15% - -10% input fluctuation
Safety Devices Against overvoltage, over current, overloading, abnormal input voltage, abnormal cooling water, abnormal interlocks, e.g. on operation panels. Optional high frequency inverter powers supply
Sample Compartment X-ray irradiation from above the sample Sample rotation at 60rpm (50/60Hz) Sample direction: Adjustable in 1° increments
Sample Loading Unit Balanced swing arm system with sample lift function
Sample Exchanger 8 Sample Turret (40 sample turret as option)
Sample Holder 7 pcs. for solid samples and 1 pc. for local analysis Sample size: 51mm diameter / 38mm high (max.)
Primary X-ray Filter Automatic exchange of five filters (Al, Ti, Ni, Zr, out)
Aperture Automatic exchange of five apertures (0.5, 3, 10, 20, 30mm diameter)
Primary Slit Automatic exchange of 3 types (Standard, High Resolution, High Sensitivity)
Attenuator Automatic ON - OFF Control (attenuation approx 1/10)
Anal. Crystal Exchanger Automatic exchange of 10 crystals; bidirectional rotation type
Analyzing Crystal LiF (200), PET, Ge, TAP as standard; LiF (220), SX-52, SX-1, SX-14, SX-48, SX-58, SX-76, SX-410, as option
Detector Scintillation counter (SC) for heavy elements Proportional counter (FPC) for light elements; Aluminum deposited 0.6um thick film window, Cartridge type filament