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Instrument Database:
Physical Electronics - Quantera Scanning X-ray Microprobe
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Physical Electronics
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Surface Analysis: ESCA/XPS
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The Quantera, PHI\\\'s next generation Scanning X-ray Microprobe provides the sensitivity and tools needed to apply XPS to a broader range of current and future product development and failure analysis needs. High performance micro-area XPS, XPS depth profiling, automated insulator analysis, and robotic sample handling define a new generation of XPS instrument for today\\\'s laboratory.
Important features of the Quantera include:
- Unique scanning x-ray microprobe design with <10um diameter minimum x-ray beam size
- Complete XPS capabilities (spectroscopy, depth profiling, mapping, etc.) at all x-ray beam sizes
- Highest performance XPS instrument for thin film analysis (depth profiling)
- Automated effortless analysis of electrically insulating samples
- Accurate quantitative analysis
- Robotic sample handling
- A completely automated, easy to use system
Micro area spectroscopy and high performance thin film analysis capabilities open new areas of application for XPS in all environments. The complete automation of the system makes it easy to use and increases the reproducibility of routine measurements. Large sample platens make it possible to analyze “real world” large samples or multiple small samples automatically. A new generation XPS instrument is available today from PHI.
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