scanning electron microscopy (SEM)

A method employing an electron microscope and a finely focused beam of electrons that is moved across a sample allowing the surficial textures to be examined at high resolution and the image displayed. By collecting the emitted electrons from a single spot (size 1-10 microns)
chemical analysis of portions of the sample, i.e. a specific mineral species, can be made using energy dispersive x-ray analysis (SEM/EDXA).