static secondary ion mass spectrometry (SSIMS)

SIMS method featuring primary ion current densities (corresponding to SIMS gun flux) of 2 ~ 3 nA/cm2 or less and primarily used in analysis of sample surface components. The method is therefore distin-guished from dynamic SIMS, which is used for analysis of components in the depth direction. When the sample is an organic molecule in solid form, the term is changed to organic SIMS or molecular SIMS.