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Bruker introduces New TXRF Spectrometer at the Analytica 2016


This benchtop TXRF spectrometer offers significantly improved detection limits and excellent flexibility regarding the variety of sample types in combination with automatic quality control. Thus the instrument is predestined for continuous 24/7 routine operation. Rounded off by a contemporary, functional design, a minimal footprint and a high level of ergonomics, the new TXRF spectrometer is ideally suited for a variety of applications in trace element analysis. Depending on requirements, this instrument is an efficient complement or a real alternative to ICP.

Selected key features of the new TXRF spectrometer:

Three excitation modes and XFlash® SDD Technology
Currently available TXRF spectrometers only use one X-ray excitation, whereby the detectable element range is limited. Our new instrument, in contrast, uses up to three excitation modes to optimally detect all elements from sodium to uranium. Lowest detection limits are ensured by a large area XFlash® silicon drift detector.

Designed for 24/7 multi-user operation and a variety of sample types
The automatic sample changer can be equipped with up to ten sample trays with a total capacity of 90 sample carriers. The 24/7 multi-user operation is supported by LEDs that indicate the respective processing statuses. Depending on the application, a variety of different sample carriers and sample types can be analyzed:
  • Quartz carriers for the analysis of solutions, suspensions and solids
  • Wafer for contamination analysis and applications in materials sciences
  • Microscope slides for the analysis of cell cultures, smears or thin sections

Extremely simple sample preparation
Unlike in other atomic spectroscopic methods, such as ICP and AAS, sample preparation for TXRF is extremely simple. Additionally, the user can rely on a specifically developed range of accessories for efficient sample preparation and to avoid any contamination.

Compliant to GLP/GMP regulations
The instrument's analysis software meets the typical requirements of a laboratory under GLP/GMP conditions. The spectrometer comes with internal QA samples that are used to perform regular checks of all crucial system parameters — automatically and in the background. Measurement results are automatically calculated and statistically processed. In case of deposited standard concentrations or thresholds, recovery rates are calculated and impermissible deviations are displayed.

In its development, special attention was given to application fields that are subject to increasing demands and legal regulations:
  • Development of new products in the food industry, quality assurance in production, traceability and verification of raw materials
  • Compliance to new EU and US Pharmacopeia standards regarding the detection of metal contamination in pharmaceutical research and industry
  • Monitoring and control of water, wastewater, air and soil to ensure a healthy environment

Come by and see the new TXRF spectrometer live at Analytica 2016 at the Bruker booth #310 in hall A2. Bruker cordially invites you to join one of our instrument demos.

 Related EVISA Resources

EVISA Company Database: Bruker Nano GmbH
EVISA Instrument Database: TXRF Instruments
EVISA's Agenda of Events: Analytica 2016


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