Bruker announced that a NEW TXRF spectrometer for high performance ultra-trace element analysis will be introduced at this year’s Analytica in Munich.
This benchtop TXRF spectrometer offers significantly improved detection
limits and excellent flexibility regarding the variety of sample types
in combination with automatic quality control. Thus the instrument is
predestined for continuous 24/7 routine operation. Rounded off by a
contemporary, functional design, a minimal footprint and a high level of
ergonomics, the new TXRF spectrometer is ideally suited for a variety
of applications in trace element analysis. Depending on requirements,
this instrument is an efficient complement or a real alternative to ICP.
Selected key features of the new TXRF spectrometer:
Three excitation modes and XFlash® SDD TechnologyCurrently available TXRF spectrometers only use one X-ray excitation, whereby the detectable element range is limited. Our new instrument, in contrast, uses up to three excitation modes to optimally detect all elements from sodium to uranium. Lowest detection limits are ensured by a large area XFlash® silicon drift detector.
Designed for 24/7 multi-user operation and a variety of sample typesThe automatic sample changer can be equipped with up to ten sample trays with a total capacity of 90 sample carriers. The 24/7 multi-user operation is supported by LEDs that indicate the respective processing statuses. Depending on the application, a variety of different sample carriers and sample types can be analysed:
- Quartz carriers for the analysis of solutions, suspensions and solids
- Wafer for contamination analysis and applications in materials sciences
- Microscope slides for the analysis of cell cultures, smears or thin sections
Extremely simple sample preparationUnlike in other atomic spectroscopic methods, such as ICP and AAS, sample preparation for TXRF is extremely simple. Additionally, the user can rely on a specifically developed range of accessories for efficient sample preparation and to avoid any contamination.
Compliant to GLP/GMP regulationsThe instrument's analysis software meets the typical requirements of a laboratory under GLP/GMP conditions. The spectrometer comes with internal QA samples that are used to perform regular checks of all crucial system parameters — automatically and in the background. Measurement results are automatically calculated and statistically processed. In case of deposited standard concentrations or thresholds, recovery rates are calculated and impermissible deviations are displayed.
In its development, special attention was given to application fields that are subject to increasing demands and legal regulations:
- Development of new products in the food industry, quality assurance in production, traceability and verification of raw materials
- Compliance to new EU and US Pharmacopoeia standards regarding the detection of metal contamination in pharmaceutical research and industry
- Monitoring and control of water, wastewater, air and soil to ensure a healthy environment
Come by and see the new TXRF spectrometer live at Analytica 2016 at the
Bruker booth #310 in hall A2. Bruker cordially invites you to join one of our
instrument demos.
Related EVISA Resources
EVISA Company Database: Bruker Nano GmbH EVISA Instrument Database: TXRF Instruments
last time modified: September 24, 2024
