Echelle

A diffraction grating designed to operate with incident and diffracted light at an angle greater than 45° from the grating normal.



The term "Echelle" was found in the following pages:

Instrument database: Teledyne Instruments Leeman Labs Inc. - Prodigy DC arc
Instrument database: Analytik Jena GmbH - contrAA 700 - High-Resolution Continuum Source Atomic Absorption Spectrometer
Instrument database: Bodenseewerk Perkin-Elmer GmbH - SIMAA 6000
Instrument database: Thermo Scientific - iCAP™ 7600 - ICP-OES Analyzer
Instrument database: Thermo Scientific - iCAP™ 7200 - ICP-OES Analyzer
Instrument database: Photon Machines Inc. - Crossfire™ Benchtop LIBS elemental analysis system
Instrument database: Perkin-Elmer Corp. - Optima 3000
Instrument database: Applied Research Laboratories (ARL) - MAXIM - Simultaneous ICP-OES Spectrometer
Instrument database: PerkinElmer Inc. - Optima 4300 DV ICP-OES
Instrument database: Varian Inc. - Vista MPX Simultaneous ICP-OES
Instrument database: Thermo Scientific - SOLAAR M Series AA Spectrometer
Instrument database: Varian Inc. - Vista-PRO Simultaneous ICP-OES
Instrument database: PerkinElmer Inc. - Optima 2000 DV
Instrument database: Agilent Technologies Inc. - 710 Series ICP-OES instruments
Instrument database: Thermo Scientific - iCAP™ PRO Duo ICP-OES
Instrument database: PerkinElmer Inc. - SIMAA 6100
Instrument database: LLA Instruments GmbH - LIPAN 3001 Laser-Plasma-Analyzer
Instrument database: Varian Inc. (Part A) - Vista MPX Simultaneous ICP-OES
Instrument database: Analytik Jena AG - contrAA 600 – High-resolution continuum source AAS for the graphite furnace technique
Instrument database: Thermo Scientific - IRIS Intrepid II