Echelle
A diffraction grating designed to operate with incident and diffracted light at an angle greater than 45° from the grating normal.
The term "Echelle" was found in the following pages:
Instrument database: PerkinElmer Inc. - Optima 4300 DV ICP-OES
Instrument database: Photon Machines Inc. - Crossfire™ Benchtop LIBS elemental analysis system
Instrument database: PerkinElmer Inc. - Optima 2000 DV
Instrument database: Analytik Jena AG - contrAA 700 - High-Resolution Continuum Source Atomic Absorption Spectrometer
Instrument database: Varian Inc. (Part A) - Vista-PRO Simultaneous ICP-OES
Instrument database: LLA Instruments GmbH - Echelle Spectra Analyzer ESA 3000
Instrument database: Thermo Scientific - iCAP 6200 dual-view ICP emission spectrometer
Instrument database: LSA Lina-Spark Applications SARL - LINA Spark Analyzer
Instrument database: Andor Technology - MECHELLE - ME5000 Spectrograph
Instrument database: LLA Instruments GmbH - LIPAN 3001 Laser-Plasma-Analyzer
Instrument database: SII Nano Technology Inc. - SPS 7800 Bench-top Optical Emission Spectrophotometer
Instrument database: Thermo Scientific - iCAP™ PRO Duo ICP-OES
Instrument database: Thermo Scientific - SOLAAR M Series AA Spectrometer
Instrument database: Marwan Technology s.r.l. - Modì - Double - pulse Laser Induced Breakdown Spectrometer
Instrument database: Teledyne Instruments Leeman Labs Inc. - Prodigy DC arc
Instrument database: Agilent Technologies Inc. - 710 Series ICP-OES instruments
Instrument database: Analytik Jena AG - contrAA 600 – High-resolution continuum source AAS for the graphite furnace technique
Instrument database: Shimadzu Europe - ICPE-9000
Instrument database: Bodenseewerk Perkin-Elmer GmbH - SIMAA 6000
Instrument database: Teledyne Instruments Leeman Labs Inc. - Prodigy High Dispersion ICP