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The establishment of EVISA is funded by the EU through the Fifth Framework Programme (G7RT- CT- 2002- 05112).
Supporters of EVISA includes:
Instrument Database:
Austin AI, LLC - APD2000 - High-precision, vertical/horizontal goniometer
Year of introduction
Status
available
Company
Austin AI, LLC
Categories
X-ray spectrometer: XRD
High-precision, vertical/horizontal goniometer
High speed rate (1000°/min) and high precision angle reproducibility (±0.001°) provide fast measurement and highly reliable data. The goniometer is essentially composed of two precision gear-wheels, supported by high precision ball races. Each wheel is coupled to an anodised aluminium disk, upon which are turned some grooves for easy mounting of accessories.
Easy to handle: compact dimensions permit vertical and horizontal mounting by utilising a suitable optical stand.
The X-ray beam collimation is obtained by a series of fixed but interchangeable bayonet-joint slits that guarantee a perfect alignment of the beam in the horizontal direction, while in the vertical direction the divergence is limited by Soller slits.
The bracket of the incident beam slits, is mounted on the X-ray tube shield; this greatly facilitates the alignment, that is already simplified by the micrometric movements of the horizontal and vertical stand, about X-Y-Z axis.
Features
Multi-purpose X-ray diffractometer
Ultra stable X-ray generator with an on-board microprocessor controlled via a PC serial port
Tube shield with a tube that can be rotated to allow the use of the point or the line focus
Focusing Ka1 monochromators for high intensity and resolution
Parallel-beam optics using a Max-FluxTM Optical System
Possibility of changing automatically from transmission to reflection mode
High precision, high speed goniometer
Secondary monochromator suitable for Ag, Cr, Fe, Cu, Co and Mo radiations
Xenon gas filled proportional, scintillation, linear and curved position-sensitive detectors
Non-ambient analysis, low and high temperature attachments
Microsoft’s Windows 98/NT/2000/ME operating system in a 32-bit environment for data processing and instrument control
Crystallographic software including Rietveld’s refinement
The latest multi-functional diffraction system developed by Ital Structures
Data accuracy, simplicity of use and great versatility are the main features of this multi-functional system.
The APD 2000 digital powder diffraction system incorporates the most advanced digital electronics, computers and Microsoft’s Windows 98/NT/2000/ME operating system.
The APD 2000 diffractometer can be equipped with various attachments for your special field of research. In addition, custom-designed accessories can be manufactured to your specifications.
Great attention has been given to operator safety: a series of devices are used to prevent accidental danger from irradiation and an X-ray proof cabin covers the working table.
The APD 2000 offers solutions for a wide range of analytical requirements, from routine qualitative and quantitative analysis, to residual-stress analysis, thin films, texture, non-ambient analyses, retained austenite quantification, crystallite size/lattice strain and crystallinity calculations.
Fields of application include: environment, soil/rocks, clay, minerals, ceramics, cement, glass, petroleum, catalysts, polymers, agricultural science, biosciences, chemicals, pharmaceuticals, cosmetics, paints, nuclear, steels, textiles, electronic and magnetic materials.
Specifications
X-ray generator (PC-Controlled)
Maximum output power:
3 kW
Output stability:
<0.01% (for 10% power supply fluctuation)
Max. output voltage:
60 kW
Max. output current:
60 mA
Voltage step width:
0.1 kV
Current step width:
0.1 mA
PC control serial mode:
X-ray ON/OFF, settings of kV and mA, shutters
Safety devices:
Door interlock mechaninsm, emergency push button X-ray ON lamp
Weight:
45 kg
Size:
Width 48.3 cm, height 22 cm, depth 63 cm
X-ray tube
Type:
Glass, Cu anode, fine focus
Focus:
0.4 x 8 mm
Max. output:
1.5 kW
Goniometer
Type:
GD 2000 Independent theta/2 theta, vertical or horizontal type.
Variable scanning radius:
175 - 220 mm
Vertical scanning angular range:
-60° < 2 theta < +165°
Horizontal scanning angular range:
-110° < 2 theta < +165°
Smallest selectable stepsize:
0.001° (2 theta)
Angular reproducibility:
±0.001° (2 theta)
Scanning speed:
0.05° - 50°/min
Slewing speed:
1000°/min
Modes of operation:
Continuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation
Sample holder:
20 x 15 x 2 mm
Divergence slits:
4°; 2°; 1°; 1/2°; 1/4°
Anti-divergence slits:
4°; 2°; 1°; 1/2°; 1/4°
Receiving slits:
0.3; 0.2; 0.1 mm
Soller slits:
2°; 5°
Detector:
Type:
Scintillation Counter NaI
Countrate:
500000 c/s
HV/PHA:
High voltage supply 600 - 2000 V, gain, low, central and high level control
Case:
Dimensions:
Width 1190mm, height 1680mm, depth 800mm
Leakage X-rays:
< 1 mSv/Year
Processing Unit
Computer type:
Personal computer, the latest version
Items controlled:
X-ray generator, goniometer, detector, counting chain
Basic data processing:
Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Four data buffers available. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples.
Events
See the complete list of deadlines!
Winter Conference on Plasma Spectrochemistry
12.01.2026
Tucson, AZ
Gordon Research Seminar: Bioinorganic Chemistry
16.01.2026
Ventura, California, United States
Gordon Research Conference: Metals in Biology
18.01.2026
Ventura, California, United States
... more Events
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