Instrument Database:
Seiko Instruments Inc. - SEA2200A Series Hazardous Substance Monitor
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Year of introduction |
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Status |
historical ( out of sale ) |
Company |
Seiko Instruments Inc.
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Categories |
X-ray spectrometer: XRF |
OverviewIn accordance with the European Union's issuance of RoHS directive in February 2003, the use of cadmium, lead and other hazardous substances in electric/electronic appliances will be banned beginning July 2006. In response, makers of export goods must conduct stricter inspections as well as start the designing of compliant goods at an early date. SEA2200A is standard equipped with a compensation software that minimizes effects of the measurement sample's shape, thickness and composition, and as it can quickly and make measurements without preparing samples such as cadmium, lead and other hazardous substances in plastic products, it is useful for inspecting large volumes of goods. Features- Successor to the SEA2100 series
- Compliant with measurement of extremely small amount of Cd, Pb, Hg, Br and Cr
- Newly developed first filter enables detection of Cd and Pb leveled several ppm in plastic samples
- Correcting function has made the measurement free from preparing samples to equalize their form, thickness and dimension
- One measurement condition can be used for various plastics
- Equipped with 2 type collimators: round 10mm and 3mm
- Equipped with large sample chamber (300mm x 170mm x 75mm)
- Alignments of small samples are easily operated by using CCD camera
- Equipped with hazardous metals data management mechanism that makes comparison between detailed sample data and measurement results easy
- Equipped with the detector that measures extremely light elements such as carbon, nitrogen, oxygen and fluorine (SEA2220)
- Links with Microsoft Word ® to easily create reports
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Specifications |
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Specifications Elements Measur Atomic Numbers 11 (Na) to 92 (U) Sample Form Solids, Powder and Liquids (using specified sample cup) X-ray Generating System Rh Target, Tube voltage: 50kV,Current: 1mA Detector Si (Li) semiconductor detector LN2 Dewar Capacity 10L Irradiation Area Round 3, 10mm Sample Observation CCD Camera Filter 3 types Filter 3 types X-ray station PC, 17-inch CRT Printer Inkjet Printer Quantitative Software FP Method, Calibration Curve Method Qualitative Software Automatic Identification, Comparison Function Statistical Processing MS Excel ® Installed Report Creation MS Word ® Installed Power Supply 100V 15A
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